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IEC PAS 62189:2000

IEC PAS 62189:2000

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Bias Life

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

02-23-2004

Language(s)

English

Published date

11-28-2000

Publisher

International Electrotechnical Committee

FOREWORD
1 Purpose
2 Apparatus
3 Procedure
4 Cool-down
5 Measurements
6 Failure criteria
7 Summary

This test is performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device qualification and reliability monitoring.

DocumentType
Miscellaneous Product
Pages
6
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
NEN NPR IEC/PAS 62189 : 2001 Identical

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Hardcopy - English
PDF - English
PDF 3 Users - English
PDF 5 Users - English
PDF 9 Users - English
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