![header thumbnail](/images/publishers\astm_cover.gif)
ASTM E 2534 : 2020
Current
Current
The latest, up-to-date edition.
![header thumbnail](/images/publishers\astm_cover.gif)
Standard Practice for Targeted Defect Detection Using Process Compensated Resonance Testing Via Swept Sine Input for Metallic and Non-Metallic Parts
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-13-2021
Committee |
E 07
|
DocumentType |
Standard Practice
|
Pages |
10
|
PublisherName |
American Society for Testing and Materials
|
Status |
Current
|
Supersedes |
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