MEASUREMENT OF RADIATED EMISSIONS FROM INTEGRATED CIRCUITS - TEM/WIDEBAND TEM (GTEM) CELL METHOD; TEM CELL (150 KHZ TO 1 GHZ), WIDEBAND TEM CELL (150 KHZ TO 8 GHZ)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

22-09-2017

Publisher

SAE International

1 Scope
2 References
3 Definitions
4 Test Conditions
5 Test equipment
6 Test set-up
7 Test procedure
8 Data presentation
9 IC Emissions reference levels
10 Notes
Appendix A - Example calibration and set up verification sheet
Appendix B - 1 GHz tem cell and wideband tem cell
Appendix C - Calculation of dipole moment from measured data
Appendix D - Specification of emission levels

This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC).

Committee	EMCS
DocumentType	Standard
Pages	16
ProductNote	This standard is now stabilized
PublisherName	SAE International
Status	Current
Supersedes	SAE J 1752/3 : 2011

SAE J 1752/1 : 2016

ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS - INTEGRATED CIRCUIT EMC MEASUREMENT PROCEDURES - GENERAL AND DEFINITIONS