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IEEE 1671.1-2009
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
English
11-12-2009
1. Overview
2. Normative references
3. Definitions, acronyms, and abbreviations
4. Test Description schema
5. Describing test program structure
6. Describing control flow
7. Describing data
8. Describing test behavior
9. Describing fault isolation
10. ATML Test Description XML schema names and
locations
11. ATML XML schema extensibility
12. Conformance
Annex A (normative) - XML schemas
Annex B (informative) - TSF library examples
Annex C (informative) - Describing digital testing
Annex D (informative) - Describing serial digital bus exchanges
Annex E (informative) - IEEE download web-site material
associated with this document
Annex F (informative) - Users information and examples
Annex G (informative) - Glossary
Annex H (informative) - Bibliography
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