I.S. EN IEC 60749-28:2022
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022)
Hardcopy , PDF
English
25-04-2022
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Required equipment
5 Periodic tester qualification, waveform records, and waveform verification requirements
6 CDM ESD testing requirements and procedures
7 CDM classification criteria
Annex A (normative) Verification module (metal disc) specifications and cleaning guidelines for verification modules and testers
Annex B (normative) Capacitance measurement of verification modules (metal discs) sitting on a tester field plate dielectric
Annex C (normative) Testing of small package integrated circuits and discrete semiconductors (ICDS)
Annex D (informative) CDM test hardware and metrology improvements
Annex E (informative) CDM tester electrical schematic
Annex F (informative) Sample oscilloscope setup and waveform
Annex G (informative) Field-induced CDM tester discharge procedures
Annex H (informative) Waveform verification procedures
Annex I (informative) Determining the appropriate charge delay for full charging of a large module or device
Annex J (informative) Electrostatic discharge (ESD) sensitivity testing direct contact charged device model (DC-CDM)
Bibliography
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