ASTM E 986 : 2004 : R2017
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Standard Practice for Scanning Electron Microscope Beam Size Characterization
Hardcopy , PDF
10-04-2024
English
12-06-2017
CONTAINED IN VOL. 03.01, 2017 Defines a reproducible means by which one aspect of the performance of a scanning electron microscope (SEM) may be characterized.
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.