NEN ISO 24173 : 2009
Current
The latest, up-to-date edition.
MICROBEAM ANALYSIS - GUIDELINES FOR ORIENTATION MEASUREMENT USING ELECTRON BACKSCATTER DIFFRACTION
12-01-2013
Provides advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It also addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
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