BS EN 62373:2006
Current
The latest, up-to-date edition.
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Hardcopy , PDF
English
29-09-2006
INTRODUCTION
1 Scope
2 Terms and definitions
3 Test equipment
3.1 Equipment
3.2 Requirement for handling
4 Test sample
4.1 Sample
4.2 Packaging
4.3 ESD protection circuit
5 Procedure
5.1 Initial measurement and read point measurement
5.2 Test
5.3 Notes for field MOSFET
5.4 Judgment
Annex A (informative) Wafer level reliability test (WLR test)
Bibliography
Figures
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